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MSEN 6327 (Overall) | |||||
MSEN 6327 Chadwin Young | |||||
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MSEN 6327 (Overall) | |||||
MSEN 6327 Chadwin Young | |||||
Semiconductor Device Characterization
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or MSEN 6325 or equivalent) or instructor consent required.
Offering Frequency: Every two years
This professor/course combination hasn't been taught in the semesters you selected. To see more grade data, try changing your filters.
Grades: 0
Median GPA: None
Mean GPA: None
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Semiconductor Device Characterization
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or MSEN 6325 or equivalent) or instructor consent required.
Offering Frequency: Every two years
This professor/course combination hasn't been taught in the semesters you selected. To see more grade data, try changing your filters.
Grades: 0
Median GPA: None
Mean GPA: None
Click a checkbox to add something to compare.