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MSEN 6327 Chadwin Young | |||||
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MSEN 6327 Chadwin Young | |||||
Grades: 783
Median GPA: A
Mean GPA: 3.656
5
Professor rating
1.5
Difficulty
2
Ratings given
100%
Would take again
Semiconductor Device Characterization
MSEN 6327
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or MSEN 6325 or equivalent) or instructor consent required.
Offering Frequency: Every two years
Grades: 8
Median GPA: A
Mean GPA: 3.709
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Grades: 783
Median GPA: A
Mean GPA: 3.656
5
Professor rating
1.5
Difficulty
2
Ratings given
100%
Would take again
Semiconductor Device Characterization
MSEN 6327
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or MSEN 6325 or equivalent) or instructor consent required.
Offering Frequency: Every two years
Grades: 8
Median GPA: A
Mean GPA: 3.709
Click a checkbox to add something to compare.