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Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
MSEN 6327 (Overall) | |||||
A | |||||
MSEN 6327 Chadwin Young | |||||
Not teaching in Spring 2026 | |||||
MSEN 6327 Chris Hinkle | |||||
A | |||||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
MSEN 6327 (Overall) | |||||
A | |||||
MSEN 6327 Chadwin Young | |||||
Not teaching in Spring 2026 | |||||
MSEN 6327 Chris Hinkle | |||||
A | |||||
Semiconductor Device Characterization
MSEN 6327
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or MSEN 6325 or equivalent) or instructor consent required.
Offering Frequency: Every two years
Grades: 8
Median GPA: A
Mean GPA: 3.709
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Semiconductor Device Characterization
MSEN 6327
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or MSEN 6325 or equivalent) or instructor consent required.
Offering Frequency: Every two years
Grades: 8
Median GPA: A
Mean GPA: 3.709
Click a checkbox to add something to compare.