Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
My PlannerExplore and compare past grades, professor ratings, and reviews to find the perfect class.
Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
Not teaching in Spring 2026 | |||||
MSEN 5361 (Overall) | |||||
MSEN 5361 Amy Walker | |||||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
Not teaching in Spring 2026 | |||||
MSEN 5361 (Overall) | |||||
MSEN 5361 Amy Walker | |||||
Fundamentals of Surface and Thin Film Analysis
MSEN 5361
Erik Jonsson School of Engineering and Computer Science
Survey of materials characterization techniques; Rutherford backscattering; secondary ion mass spectroscopy; ion channeling; scanning tunneling and transmission microscopy; x-ray photoelectron and Auger electron spectroscopy; x-ray and electron diffraction. 3 credit hours.
Prerequisite: MSEN 5360 or equivalent.
Offering Frequency: Based on student interest and instructor availability
This professor/course combination hasn't been taught in the semesters you selected. To see more grade data, try changing your filters.
Grades: 0
Median GPA: None
Mean GPA: None
Click a checkbox to add something to compare.
Fundamentals of Surface and Thin Film Analysis
MSEN 5361
Erik Jonsson School of Engineering and Computer Science
Survey of materials characterization techniques; Rutherford backscattering; secondary ion mass spectroscopy; ion channeling; scanning tunneling and transmission microscopy; x-ray photoelectron and Auger electron spectroscopy; x-ray and electron diffraction. 3 credit hours.
Prerequisite: MSEN 5360 or equivalent.
Offering Frequency: Based on student interest and instructor availability
This professor/course combination hasn't been taught in the semesters you selected. To see more grade data, try changing your filters.
Grades: 0
Median GPA: None
Mean GPA: None
Click a checkbox to add something to compare.