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Fundamentals of Surface and Thin Film Analysis
MSEN 5361
Erik Jonsson School of Engineering and Computer Science
Survey of materials characterization techniques; Rutherford backscattering; secondary ion mass spectroscopy; ion channeling; scanning tunneling and transmission microscopy; x-ray photoelectron and Auger electron spectroscopy; x-ray and electron diffraction. 3 credit hours.
Prerequisite: MSEN 5360 or equivalent.
Offering Frequency: Based on student interest and instructor availability
Grades: 17
Median GPA: B+
Mean GPA: 3.165
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Fundamentals of Surface and Thin Film Analysis
MSEN 5361
Erik Jonsson School of Engineering and Computer Science
Survey of materials characterization techniques; Rutherford backscattering; secondary ion mass spectroscopy; ion channeling; scanning tunneling and transmission microscopy; x-ray photoelectron and Auger electron spectroscopy; x-ray and electron diffraction. 3 credit hours.
Prerequisite: MSEN 5360 or equivalent.
Offering Frequency: Based on student interest and instructor availability
Grades: 17
Median GPA: B+
Mean GPA: 3.165
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