My PlannerExplore and compare past grades, professor ratings, and reviews to find the perfect class.
Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Grades:
Median GPA:
Mean GPA:
5.0
Professor rating
5.0
Difficulty
1,000
Ratings given
99%
Would take again
Visit Rate My Professors
Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
Not teaching in Spring 2026 | |||||
EEMF 6327 Chris Hinkle | |||||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
Not teaching in Spring 2026 | |||||
EEMF 6327 Chris Hinkle | |||||
Semiconductor Device Characterization
EEMF 6327
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or equivalent) or instructor consent required.
Offering Frequency: Every two years
Grades: 23
Median GPA: A
Mean GPA: 3.769
Click a checkbox to add something to compare.
Semiconductor Device Characterization
EEMF 6327
Erik Jonsson School of Engineering and Computer Science
This course will describe the theoretical and practical considerations associated with the most common electrical and reliability characterization techniques used in the semiconductor industry. 3 credit hours.
Prerequisite: (EEMF 6320 or MSEN 6320 or equivalent) or instructor consent required.
Offering Frequency: Every two years
Grades: 23
Median GPA: A
Mean GPA: 3.769
Click a checkbox to add something to compare.
