My PlannerExplore and compare past grades, professor ratings, and reviews to find the perfect class.
Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Grades:
Median GPA:
Mean GPA:
5.0
Professor rating
5.0
Difficulty
1,000
Ratings given
99%
Would take again
Visit Rate My Professors
Grades:
Median GPA:
Mean GPA:
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating |
|---|---|---|
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
A+ | ||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
EEDG 6303 Mehrdad Nourani | |||||
B+ | |||||
Search Results
| Name | Grades | Rating | |||
|---|---|---|---|---|---|
EEDG 6303 Mehrdad Nourani | |||||
B+ | |||||
Grades: 391
Median GPA: B+
Mean GPA: 3.250
3.2
Professor rating
3.3
Difficulty
28
Ratings given
58%
Would take again
Testing and Testable Design
EEDG 6303
Erik Jonsson School of Engineering and Computer Science
Techniques for detection of failures in digital circuits and systems. Fault modeling and detection. Functional testing and algorithms for automatic test pattern generation (ATPG). Design of easily testable digital systems. Techniques for introducing built-in self test (BIST) capability. Test of various digital modules, such as PLA's, memory circuits, datapath, etc. 3 credit hours.
Prerequisites: EE 3320 or equivalent and background in VHDL/Verilog.
Offering Frequency: Each year
Grades: 201
Median GPA: B+
Mean GPA: 3.371
Click a checkbox to add something to compare.
Grades: 391
Median GPA: B+
Mean GPA: 3.250
3.2
Professor rating
3.3
Difficulty
28
Ratings given
58%
Would take again
Testing and Testable Design
EEDG 6303
Erik Jonsson School of Engineering and Computer Science
Techniques for detection of failures in digital circuits and systems. Fault modeling and detection. Functional testing and algorithms for automatic test pattern generation (ATPG). Design of easily testable digital systems. Techniques for introducing built-in self test (BIST) capability. Test of various digital modules, such as PLA's, memory circuits, datapath, etc. 3 credit hours.
Prerequisites: EE 3320 or equivalent and background in VHDL/Verilog.
Offering Frequency: Each year
Grades: 201
Median GPA: B+
Mean GPA: 3.371
Click a checkbox to add something to compare.