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Testing and Testable Design
EEDG 6303
Erik Jonsson School of Engineering and Computer Science
Techniques for detection of failures in digital circuits and systems. Fault modeling and detection. Functional testing and algorithms for automatic test pattern generation (ATPG). Design of easily testable digital systems. Techniques for introducing built-in self test (BIST) capability. Test of various digital modules, such as PLA's, memory circuits, datapath, etc. 3 credit hours.
Prerequisites: EE 3320 or equivalent and background in VHDL/Verilog.
Offering Frequency: Each year
Grades: 184
Median GPA: B+
Mean GPA: 3.390
Click a checkbox to add something to compare.
Testing and Testable Design
EEDG 6303
Erik Jonsson School of Engineering and Computer Science
Techniques for detection of failures in digital circuits and systems. Fault modeling and detection. Functional testing and algorithms for automatic test pattern generation (ATPG). Design of easily testable digital systems. Techniques for introducing built-in self test (BIST) capability. Test of various digital modules, such as PLA's, memory circuits, datapath, etc. 3 credit hours.
Prerequisites: EE 3320 or equivalent and background in VHDL/Verilog.
Offering Frequency: Each year
Grades: 184
Median GPA: B+
Mean GPA: 3.390
Click a checkbox to add something to compare.